Join Our Exclusive Webinar: Discover the Future of 3D X-ray Microscopy with EclipseXRM™!

Sigray will be hosting an exclusive webinar focusing on how EclipseXRM is revolutionizing fields such as failure analysis, 3D printing, geology, battery cathode and anode device characterization, and biological research. This will be presented by Jeff Gelb, the Director of X-ray Microscopy at Sigray.

Examples will be presented on how EclipseXRM™ has revolutionized fields in failure analysis, 3D printing, geology, battery cathode and anode device characterization, and biological research. Its unparalleled flexibility and commercially-leading resolution performance make it the ultimate tool for researchers in busy Central Laboratories.

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Due to the popularity of Sigray webinars, we are pleased to offer two sessions: one for Asia (July 19th Asia / corresponds to July 18th in USA) and one for Europe/USA (July 18th):

USA/Europe/Middle East (July 18 8am PST, 11am EST) https://us02web.zoom.us/webinar/register/4217190068784/WN_qaqPfotrTsCkQdOQfbIZnA
Asia (July 19th 11am China/Singapore, 12pm Japan/Korea – which corresponds to 8pm July 18 in the USA)
https://us02web.zoom.us/webinar/register/8917190069353/WN_kEcNV9z2RN2ghnbDoRJu5g