Novel Tri-Contrast Capabilities
Spatial resolution 0.5 µm
Designed for in-situ Experiments
- 3D x-ray microscope with industry-leading spatial resolution
Achieve down to 0.5 µm spatial resolution and <100nm voxels
- Maximum versatility with novel contrast mechanisms
Patented multi-spectral source (MSS) for quasi-monochromatic illumination to allow up to 10X throughput on the most difficult-to-image, low contrast samples
- Multiple detectors in a single system
Optimize your field of view and resolution
500nm Spatial Resolution
PrismaXRM achieves the highest spatial resolution available on the market at 500nm (0.5 µm).
Shown below are individual eggs resolved in the eggs sacks of a daphnia (water flea) specimen.
Novel Multi-Spectral Imaging Enables Maximum Versatility
PrismaXRM was engineered to address the needs of busy central research facilities, which encounter a wide variety of sample shapes, sizes, and composition. The research facilities are often tasked with imaging the samples at the best quality and at the fastest acquisition times. Because no single set of components can address the full range, PrismaXRM can incorporate multiple x-ray sources and detectors into a single system. One key option is a Multi-Spectral Source (MSS) that is also used in Sigray’s ChromaXRM system. This source provides multiple quasi-monochromatic beams of x-rays (unlike the polychromatic x-rays produced by most system’s sources) to provide the outstanding contrast needed for extremely challenging samples, such as low-Z structures in novel lithium battery concepts and biological samples.
PrismaXRM offers both Quantitative Phase and propagation phase contrast capabilities. Unlike propagation phase contrast, which is an edge-enhancing technique, Quantitative Phase provides direct access to the refractive index of a material, allowing decoupling of the material’s atomic number (Z) from its density. This complements absorption contrast which is a convolution of Z and density. Quantitative Phase also provides excellent performance for biological materials and polymers – and is particularly sensitive to voids and cracks.
Multiple Fields of View with Integrated Detectors
Multiple detector configuration options are available within the same system, enabling selection between multiple resolution and field-of-view settings analogous to a visible light microscope. Below is an example workflow in which detector modes are switched by software to zoom in on features of interest in an intact medicine container.
Nanofocus X-ray Source and Optional Second Source
PrismaXRM offers an industry-leading sealed tube nanofocus x-ray source optimized for imaging a wide variety of sample types. The source is complemented with an optional patented x-ray source, selectable between a novel tri-contrast x-ray source or a multi-target x-ray source. The choice of up to two sources per system offers the maximum flexibility for busy central laboratories that must cater to a wide range of applications requests. We offer push-button selection so that each scan is optimized with the appropriate x-ray source.
All PrismaXRM sources are maintenance-free without the cost of consumables or requiring frequent downtimes for filament changes.
Software: GigaRecon Tomography & Sigray3D Acquisition
GigaRecon | Tomographic reconstruction software that pairs the fastest reconstruction times with an unmatched suite of features for achieving the best result every time. Reconstruction speeds of <45 seconds are achieved for 2048 x 2048 x 2200 datasets. GiagRecon provides the fastest iterative tomography reconstruction on the market, enabling high quality image reconstruction with 5X shorter data collection time, substantially accelerating tomography imaging time over conventional FDK reconstruction.Sigray3D | Intuitive Acquisition
- Easy, intuitive software gets your team up and running in no time
- Click to align the sample and start measuring in seconds
- AI powered AutoPilot suggests the optimal settings for each sample
- Queue up to 20 samples with the automated Sample Handling Robot (SHR)
Semiconductor Failure Analysis
3D x-ray microscopy has become the workhorse approach to investigating failures such as cracks and voids in semiconductor packaging. Sigray PrismaXRM offers the leading resolution, contrast, and resolution needed for quickly identifying the failure modes. In addition, the system’s novel tri-contrast enables rapid identification from a 2D radiography – without requiring a complete tomography.
Carbon Fiber Reinforced Composites
Carbon fiber reinforced polymers (CFRPs) are extremely challenging to image with conventional x-ray techniques, such as microCT, due to the low absorption of carbon fibers and the surrounding polymer matrix. Quantitative Phase™ and Subresolution Darkfield™ images acquired with the PrismaXRM provide measurements of defects and fiber orientation that cannot be observed using high-resolution absorption contrast, due to the low x-ray contrast between carbon fibers and polymers.
Technical Specifications of the PrismaXRM-500
|Overall||Spatial Resolution||0.5 um with 40X objective|
Optional second transmission or reflection source
|Voltage||30 - 160 kVp|
|Target(s)||Up to 5 targets.
Includes selection from Cr, Cu, Rh, W, Mo, Au, Ti, Ag.
Others available upon request.
|Detector(s)||Type||Up to 5 detectors. Includes LFOV detectors and high resolution detectors.|
|Camera||4MP deep cooled CCD|
|Visible Light Camera||16MP alignment camera|
|Software||Command and Control||Sigray 3D with Intuitive interface|
|Reconstruction||GigaRecon - fastest commercial CBCT reconstruction software|
|Offset Scans||Expands the horizontal FOV. Sigray software advantage|
|Helical Scan||Enabled for tall samples|
|AutoPilot||AI-assisted microscope operation for unsupervised acquisition|
|Linux Workstation||Interface is on a Windows workstation, while a separate robust Linux workstation controls the system. Advantageous for reliable 24-7 operation.|
|EPICS||Open-source software controls for maximum flexibility|
|Dimensions||Footprint||88" L x 49" W x 92" H|
|Maximum Sample Size||30cm width and 50cm height*
*Note max FOV is limited by each detector
G Zan et al. “Understanding multi-scale battery degradation with a macro-to-nano zoom through its hierarchy.” J Mat Chem A.
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Interested in how the Sigray PrismaXRM™ will help your particular application?
For a quotation and to inquire about a demonstration of the system on your particular research interests, please fill out the following inquiry form and we will get back to you within 1-2 business days.