Energy Tunability through Patented X-ray Source (Quasi-Monochromatic)
Spatial resolution 0.5 µm
Designed for in-situ Experiments

Key Advantages:

500nm Spatial Resolution

PrismaXRM achieves the highest spatial resolution available on the market at 500nm (0.5 µm).
Shown below are individual eggs resolved in the eggs sacks of a daphnia (water flea) specimen.

micro ct X-ray microscope sub-micron high resolution
Novel Multi-Spectral Imaging Enables Maximum Versatility

PrismaXRM was engineered to address the needs of busy central research facilities, which encounter a wide variety of sample shapes, sizes, and composition. The research facilities are often tasked with imaging the samples at the best quality and at the fastest acquisition times. Because no single set of components can address the full range, PrismaXRM can incorporate multiple x-ray sources and detectors into a single system. One key option is a Multi-Spectral Source (MSS) that is also used in Sigray’s ChromaXRM system. This source provides multiple quasi-monochromatic beams of x-rays (unlike the polychromatic x-rays produced by most system’s sources) to provide the outstanding contrast needed for extremely challenging samples, such as low-Z structures in novel lithium battery concepts and biological samples.

micro ct X-ray microscope sub-micron high resolution
PrismaXRM-810 can incorporate the patented Multi-Spectral Source used in the Sigray ChromaXRM-500, which provides outstanding contrast for challenging samples because it produces quasi-monochromatic x-rays.
Quantitative Phase

PrismaXRM offers both Quantitative Phase and propagation phase contrast capabilities. Unlike propagation phase contrast, which is an edge-enhancing technique, Quantitative Phase provides direct access to the refractive index of a material, allowing decoupling of the material’s atomic number (Z) from its density. This complements absorption contrast which is a convolution of Z and density. Quantitative Phase also provides excellent performance for biological materials and polymers – and is particularly sensitive to voids and cracks.

micro ct X-ray microscope sub-micron high resolution
Quantitative Phase allows phase retrieval, providing clear separation of electron density.
Multiple Fields of View with Integrated Detectors

Multiple detector configuration options are available within the same system, enabling selection between multiple resolution and field-of-view settings analogous to a visible light microscope.

System Features

Nanofocus X-ray Source and Optional Second Source

PrismaXRM offers an industry-leading sealed tube nanofocus x-ray source optimized for imaging a wide variety of sample types. The source is complemented with an optional patented x-ray source, selectable between a novel tri-contrast x-ray source or a multi-target x-ray source. The choice of up to two sources per system offers the maximum flexibility for busy central laboratories that must cater to a wide range of applications requests. We offer push-button selection so that each scan is optimized with the appropriate x-ray source.

All PrismaXRM sources are maintenance-free without the cost of consumables or requiring frequent downtimes for filament changes.

Software: GigaRecon Tomography & Sigray3D Acquisition

GigaRecon | Tomographic reconstruction software that pairs the fastest reconstruction times with an unmatched suite of features for achieving the best result every time. Reconstruction speeds of <45 seconds are achieved for 2048 x 2048 x 2200 datasets. GiagRecon provides the fastest iterative tomography reconstruction on the market, enabling high quality image reconstruction with 5X shorter data collection time, substantially accelerating tomography imaging time over conventional FDK reconstruction.

Sigray3D | Intuitive Acquisition
  • Easy, intuitive software gets your team up and running in no time
  • Click to align the sample and start measuring in seconds
  • AI powered AutoPilot suggests the optimal settings for each sample
  • Queue up to 20 samples with the automated Sample Handling Robot (SHR)
GigaRecon provides high quality data with far fewer views required
Sigray3D features an intuitive GUI for acquiring and measuring data


Semiconductor Failure Analysis

3D x-ray microscopy has become the workhorse approach to investigating failures such as cracks and voids in semiconductor packaging. Sigray PrismaXRM offers the leading resolution, contrast, and resolution needed for quickly identifying the failure modes. In addition, the system’s novel tri-contrast enables rapid identification from a 2D radiography – without requiring a complete tomography.

Virtual slice of logic routing and vias of commercial SDD
Carbon Fiber Reinforced Composites

Carbon fiber reinforced polymers (CFRPs) are extremely challenging to image with conventional x-ray techniques, such as microCT, due to the low absorption of carbon fibers and the surrounding polymer matrix. Quantitative Phase™ and Subresolution Darkfield™ images acquired with the PrismaXRM provide measurements of defects and fiber orientation that cannot be observed using high-resolution absorption contrast, due to the low x-ray contrast between carbon fibers and polymers.

Demonstration of the power of the Quantitative Phase and Subresolution Darkfield capabilities applied to an angle-interlock woven CFRP. All three images were acquired simultaneously in the PrismaXRM. Absorption contrast (what is acquired with conventional microCT) has limited contrast, while the other two images provide information on materials, weaves, and fiber orientations.
In-situ Microstructural Evolution

A significant advantage of PrismaXRM’s design is to retain high submicron resolutions for large samples, enabling high fidelity imaging of samples placed in larger in-situ cells. The 3D microstructural evolution can be imaged of samples under various conditions, including: heating, cooling, tension & compression, and more. We will provide robust in-situ solutions for your needs.

Dendritic growth imaged on PrismaXRM on a Zn-ion battery.
Ref: G Zan et al. Adv. Energy Mater. 2022.
Auxetic foam (negative Poisson ratio) imaged on PrismaXRM
Intact Batteries and Batteries in-operando

PrismaXRM provides submicron high resolution even for large samples and samples placed within in situ cells. The flexibility of the PrismaXRM in switching between multiple fields of view allows hierarchical characterization of batteries – from the full FOV to detailed region-of-interest imaging – without requiring de-packaging the battery. This allows non-destructive identification of problems such as small defects (cracks, particles) and shorts.

Read the paper published at Journal of Materials Chemistry A.

Hierarchical imaging of battery with Sigray PrismaXRM. Publication by GB Zan. Sample courtesy of J Zhang, F Monaco, G Qian, J Li, P Cloetens, P Pianetta, and Y Liu.

Technical Specifications of the PrismaXRM-810

OverallSpatial Resolution0.5 um with 40X objective
SourceType(s)Sealed tube(s)
Nanofocus standard
Optional second transmission or reflection source
Voltage30 - 160 kVp
Target(s)Up to 5 targets.
Includes selection from Cr, Cu, Rh, W, Mo, Au, Ti, Ag.
Others available upon request.
Detector(s)TypeUp to 5 detectors. Includes LFOV detectors and high resolution detectors.
Camera4MP deep cooled CCD
Visible Light Camera16MP alignment camera
SoftwareCommand and ControlSigray 3D with Intuitive interface
ReconstructionGigaRecon - fastest commercial CBCT reconstruction software
Offset ScansExpands the horizontal FOV. Sigray software advantage
Helical ScanEnabled for tall samples
AutoPilotAI-assisted microscope operation for unsupervised acquisition
Linux WorkstationInterface is on a Windows workstation, while a separate robust Linux workstation controls the system. Advantageous for reliable 24-7 operation.
EPICSOpen-source software controls for maximum flexibility
DimensionsFootprint88" L x 49" W x 92" H
Maximum Sample Size30cm width and 50cm height*
*Note max FOV is limited by each detector


G Zan et al. “Understanding multi-scale battery degradation with a macro-to-nano zoom through its hierarchy.” J Mat Chem A.

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Interested in how the Sigray PrismaXRM™ will help your particular application?
For a quotation and to inquire about a demonstration of the system on your particular research interests, please fill out the following inquiry form and we will get back to you within 1-2 business days.